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Joint Test Action Group
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#	Item
171	Microsoft Word - Automated Test of Standard Software Modules.doc Add to Reading List Source URL: www.isystem.com Language: English - Date: 2012-04-30 12:20:52 Computer buses Computing PCI eXtensions for Instrumentation Software testing LabVIEW National Instruments Joint Test Action Group Field-programmable gate array Test automation Electronics Embedded systems Technology
172	Microsoft Word - DOC-DBdoc Add to Reading List Source URL: www.chipwrights.com Language: English - Date: 2010-12-10 13:27:18 Linux-based devices Television technology Embedded systems Single-board computers HDMI High-definition television Joint Test Action Group Universal Serial Bus PHY Computer hardware Electronic engineering Electronics
173	4G-mobile pioneer proves concepts quickly using XJTAG boundary scan Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2010-09-30 10:29:20 Technology Joint Test Action Group Boundary scan 4G 3GPP Long Term Evolution LTE timeline In-circuit test Electronics manufacturing Manufacturing Electronics
174	TME www.xjtag.com XJTAG Technology Partner Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2011-10-06 05:29:23 Technology PCI eXtensions for Instrumentation Joint Test Action Group Boundary scan In-circuit test Test engineer Functional testing Test strategy Corelis Electronics manufacturing Manufacturing Electronics
175	_ V1.1 Hardware Reference Add to Reading List Source URL: www.isystem.com Language: English - Date: 2012-09-17 04:41:00 Electronic engineering Joint Test Action Group PC Card D-subminiature Microcontroller Pinout Computer hardware Embedded systems Electronics
176	onTAP® Series 4000 with ProScan B o u n d a r y S c a n Add to Reading List Source URL: www.flynn.com Language: English - Date: 2011-06-14 10:41:40 Electronic engineering Joint Test Action Group Boundary scan Serial Vector Format Field-programmable gate array Automatic test pattern generation Berkeley Software Distribution Boundary scan description language Electronics manufacturing Manufacturing Electronics
177	SBC-K7 VEmbedded PC for Instrumentation and Control with Kintex7 FPGA core and configurable FMC IO FEATURES Add to Reading List Source URL: www.entegra.co.uk Language: English - Date: 2014-03-25 05:41:25 Embedded systems Reconfigurable computing Field-programmable gate array Joint Test Action Group Xilinx Universal Serial Bus PCI Express CompactRIO Computer hardware Electronic engineering Electronics
178	Possibilities and Limits of Software Debugging Techniques Depending on the Microcontroller V10.02 Add to Reading List Source URL: www.isystem.com Language: English - Date: 2012-04-30 12:21:42 Electronic engineering Debugging Microcontrollers IEEE standards Instruction set architectures Joint Test Action Group Nexus In-circuit emulator Hardware emulation Computing Electronics Embedded systems
179	onTAP® Series 4000 with ProScan B o u n d a r y S c a n Add to Reading List Source URL: www.flynn.com Language: English - Date: 2011-06-14 10:46:28 Electronic engineering Joint Test Action Group Boundary scan Design for testing Boundary scan description language Electronics manufacturing Manufacturing Electronics
180	onTAP® Series 4000 with ProScan B o u n d a r y S c a n Add to Reading List Source URL: www.flynn.com Language: English - Date: 2011-06-14 10:46:24 Technology OnTap Web development software Joint Test Action Group Boundary scan Electronics manufacturing Electronics Electronic engineering

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